Patent DE102014211514B4 relates to a method and device for determining properties of particles in a flow medium. The invention supports optical particle characterization and spray diagnostics by analyzing light scattering signals from particles, droplets, or similar objects moving through a measurement volume.
https://patents.google.com/patent/DE102014211514B4/
The method is especially relevant for particle and droplet measurement in sprays, flows, emulsions, suspensions, and other multiphase systems. It provides a technical basis for optical measurement systems that can characterize individual particles or droplets without direct mechanical contact.
Optical Measurement of Particles and Droplets
In many industrial and scientific applications, particles and droplets move through a gas or liquid flow. Their size, velocity, optical behavior, and material-related properties can influence process stability and product quality.
Patent DE102014211514B4 addresses this challenge with an optical measurement approach. The method evaluates time-resolved light scattering signals that arise when particles or droplets interact with a shaped light field. These signals can provide information about the properties of the measured objects.
Relevance for Spray Diagnostics
The patented concept is closely connected to spray diagnostics, droplet characterization, and optical particle measurement. It supports applications where individual droplets or particles need to be detected and evaluated in real time.
This is important for spray processes, coating technology, atomization research, particle-loaded flows, and industrial process monitoring. In such processes, reliable particle and droplet information helps users understand the spray behavior and detect changes in operating conditions.
Application Potential for Particle Characterization
The invention can support measurement systems for research laboratories and industrial environments. Possible applications include spray measurement, particle characterization, droplet analysis, process monitoring, quality control, and material evaluation.
Technical Background for Advanced Measurement Systems
Patent DE102014211514B4 forms part of the technical foundation behind advanced optical measurement technologies for sprays and particle flows. It supports the development of compact measurement systems for droplet size analysis, particle velocity measurement, and process-oriented spray diagnostics.
The patented approach also connects classical optical measurement principles with later developments in AI-assisted signal analysis and modern spray monitoring technologies.